Services

Scanning electron microscope FEI Quanta 600 FEG with a microanalysis system EDAX TridentXM 4

1. Surface morphology (resolution ~ 10 nm)

2. Elemental analysis in a point ~ 1 μm, along a line and by area at depth up to 5 μm

3. Crystal structure analysis

4. Picture of magnetic contrast

5. Picture of secondary reflected electrons

Auger spectrometer PHI 700

1. Elemental analysis in a point ~ 9 nm, along a line and by area    at depth up to 50 Å

2. Elemental analysis by depth

3. Surface morphology (resolution ~ 10 nm)

4. Ion cleaning of a surface

5. Preparation of fresh chips in vacuum

X-ray Photoelectron Spectrometer PHI Quantera

1. Chemical analysis in a point ~ 100 μm, along a line and by area at depth up to 50 Å

2. Elemental analysis in a point ~ 10 μm, along a line and by area at depth up to 50 Å

3. Elemental analysis by depth

4. Chemical analysis by depth

5. Surface morphology (resolution ~ 10 μm)

6. Ion cleaning of a surface

Raman spectrometer Horiba T64000.

1. Investigation of phonons and electron excitation

2. Chemical identification of substances

3. Study of morphology and phase composition

4. Measurement of nanoparticles size

5. Investigation of distribution of tension, dislocation and measurement of structural disorder`s degree in different solid substances

6. Structural identification of nanotubes

7. 2D and 3D samples mapping

Atomic-force microscope Veeco Dimension V

1. Surface morphology (resolution ~ 1 nm)

2. Surface roughness measurement

3. Qualitative determination of friction coefficient

4. Distribution map of magnetic forces onto a surface

5. Picture of current of a surface

6. Distribution map of p- and n- conductivity of semi-conductors

7. Spreading distribution map

8. Nanoindentation

9. Oxidation

Laser particle analyzer Malvern Zetasizer Nano

1. Average radius of particles

2. Viscosity

3. Zeta potential (stability of disperse systems)

Inverted metallographic microscope of reflected light Carl Zeiss Axiovert 40 MAT

1. Surface morphology with magnification up to ×1000

2. Investigation of staining in reflected light (light field, DIC differential interference contrast, polarization, fluorescence)

Spectrofluorimeter Cary Eclipse

1. Fluorescence

2. Phosphorescence

3. Chemoluminescence

4. Bioluminescence

Spectrophotometer Varian Cary 5000

1. Photometric analysis in near-infrared radiation, in visual part of a spectrum and in near-UV radiation

2. Light transmission

3. Light absorption

4. Light reflection

5. Light dispersion

6. Polarization analysis

Laser phase interference microscope MIM-2.1

1. 3D surface microtopography

2. Optical density

Laser analyzer of elements` composition of substances and materials LEA-S500

1. Element analysis by area of 0,2-1,2 mm

Multipurpose X-ray diffraction meter Empyrean PANalytical

1. Phase analysis

2. Determination of elementary cell parameters

3. Determination of phases by layers

4. Microdiffraction

5. Texture analysis, definition of pole figures

6. Definition of crystalline stresses and sizes

7. Defectoscopy

X-ray spectrometer PANalytical Axiosmax

1. Elemental analysis from Be up to U

Stereoscopic microscope Nikon SMZ1500

1. Surface morphology with magnification up to ×500

Nanotech equipment complex «Umka 02L»

1. Surface morphology with с atomic resolution

2. Volt-Ampere characteristics

Ultrasound baths PSB-56035-05, Grand 440-35

1. Sample and product cleaning

2. Acceleration of technological process in liquid medium

3. Preparation of fine-dispersed samples for microscopy

Laser system Opotek Vibrant LD 355 II

1. Generation of radiation in the visible, ultraviolet and infrared ranges

2. Investigation of nonlinear optical properties of nanoobjects

3. Surface modification

Precision cutting machine Isomet 1000

1. Precision cutting

Automatic hydraulic compaction Simplimet 1000

1. Sample preparation - hot compaction 

Equipment for cold-filling Cast n'Vac Castable Vacuum System

1. Sample preparation - cold- filling

Grinding and polishing machine EcoMet 250+AutoMet 250

1. Grinding of molded samples

2. Polishing of molded samples

Vibration polishing machine VibroMet 2

1. Precision polishing of samples

Microhardness tester Micromet 5114

1. Measurement of hardness

2. Numerical processing of measurements

Automated gas pycnometer

Ultrapycnometer 1200e

1. Determination of materials` true density

2. Determination of materials` true volume

High-speed analyzer of surface area and pore size Nova 1000e

1. Measurement of a specific surface area by BET and STSA methods

2. Analysis of pore size

3. Analysis of pore distribution in order of size

High-temperature dilatometer DIL 402 E7/G-Py

1. Determination of change dependency of sample length when heated or chilled

Thermal analyzer STA 449 F1 Jupiter   QMS 403 Aëolos

1. Thermogravimetric measurements

2. Calorimetric measurements

3. Mass-spectrometer measurements

Installation for static mechanical tests

1. Conducting mechanical tests for compression, bending and creep in vacuum at temperatures up to 2200 ⁰C

2. Conducting mechanical tests for compression, bending and creep in inert gas at temperatures up to 2400 ⁰C